Benchtop XRD Analyzer – X-ray Diffractometer - FRINGE Family

Using X-ray diffraction on samples of bulk materials like powders, single crystals, or polycrystals, and analyzing their diffraction patterns, provides valuable information about the material's composition, atomic or molecular structure, and morphology. This method is highly effective for determining crystal structure.

The FRINGE Family's Benchtop XRD Analyzer – X-ray Diffractometer, a versatile solution for material analysis. With advanced features like integrated Sora slits for enhanced reliability and digital multi-channel analysis technology for improved diffraction intensity, the FRINGE Family offers precise and efficient polymer crystallinity analysis. Its user-friendly interface and robust capabilities make it an ideal choice for various applications, from materials research to industrial quality control. Experience simplified operation, excellent resolution, and reliable results with the FRINGE Family Benchtop XRD Analyzer.

Small but beautiful

The perfect solution for a compact laboratory

Fine approximation of the province

10 minutes of training, work immediately

Built-in water circulation system

Simplifying the complexity, scientists can focus on the experiment itself

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Available Products

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Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE CLASS

Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE CLASS

Patented new θ-2θ coupling linkage angle measuring system, single-axis drive mechanism, concise and simple, determined to be extraordinary.The…
Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE

Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE

Infinite Fringe, Make the World More ClearThe Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE is a desktop X-ray diffractometer. It integrates…
Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE EV

Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE EV

Powerful KW-class power, excellent performace benchtop XRD harvesterThe Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE EV utilizes the sola…
Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE C1600

Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE C1600

A Good Helper for Phase AnalysisBenchtop XRD Analyzer – X-ray Diffractometer – FRINGE C1600 utilizes the diffraction phenomenon of X-rays within a…
Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE SH1827

Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE SH1827

Special Analyzer for Plastic CrystallinityThe Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE SH1827 primarily utilizes X-ray diffraction…

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Titanium Nitride (TiN) Thin Film Analysis Using Torontech FRINGE Grazing Incidence X-ray Diffraction (GIXRD)

Titanium Nitride (TiN) Thin Film Analysis Using Torontech FRINGE Grazing Incidence X-ray Diffraction (GIXRD)

Understanding the structure and crystallinity of ultra-thin Titanium Nitride (TiN) coatings is crucial for quality control and product performance, especially in microelectronics, optics, and surface engineering. This article explores how Torontech's Benchtop XRD Analyzer – X-ray Diffractometer - FRINGE Family, using Grazing Incidence X-ray Diffraction (GIXRD), provides accurate phase analysis and crystallinity data for TiN films on silicon wafers, even at nanoscale thicknesses.Why Titanium Nitride (TiN) Films MatterTitanium Nitride (TiN) coatings are widely used in microelectronics, hard…